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Table of Contents - Volume 615 - 2000 MRS Spring Meeting - Symposium G – Polycrystalline Metal & Magnetic Thin Films - 2000

Editors: B. Clemens, L. Gignac, J. MacLaren, O. Thomas

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Chemical Ordering and Microstructure of FePd Thin Films with perpendicular Magnetic Anisotropy Chemical Ordering and Microstructure of FePd Thin Films with perpendicular Magnetic Anisotropy

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Gilles B., Xu F.F., Halley D., Marty A., Samson Y. and Patrat G.

MRS Proceedings / Volume 615 / 2000

DOI: http://dx.doi.org/10.1557/PROC-615-G1.7.1 (About DOI)

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X-ray Probes of Magnetic Multilayer Structure X-ray Probes of Magnetic Multilayer Structure

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B.K. Tanner, T.P.A. Hase, B.D. Fulthorpe, J. Clarke, G.M. Luo, S.K. Halder, A.S.H. Rozatian and S.B. Wilkins

MRS Proceedings / Volume 615 / 2000

DOI: http://dx.doi.org/10.1557/PROC-615-G2.1.1 (About DOI)

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Residual Stresses and Magnetoelastic Coupling in Ultrathin Fe Films Deposited on GaAs(001) Residual Stresses and Magnetoelastic Coupling in Ultrathin Fe Films Deposited on GaAs(001)

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P. Gergaud, C. Lallaizon, M. Putero, B. Lépine, O. Thomas and A. Guivarc'h

MRS Proceedings / Volume 615 / 2000

DOI: http://dx.doi.org/10.1557/PROC-615-G2.9.1 (About DOI)

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Changes in Stress and Microstructure in PtMn/CoFe Bilayers during Annealing Changes in Stress and Microstructure in PtMn/CoFe Bilayers during Annealing

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S.P. Bozeman, B.J. Daniels and D.J. Larson

MRS Proceedings / Volume 615 / 2000

DOI: http://dx.doi.org/10.1557/PROC-615-G5.6.1 (About DOI)

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In situ electrical resistance measurements of Al-Ge films in the TEM using a modified heating holder In situ electrical resistance measurements of Al-Ge films in the TEM using a modified heating holder

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M.A. Verheijen, J.J.T.M. Donkers, J.F.P. Thomassen, J.J. van den Broek, R.A.F. van der Rijt, M.J.J. Dona and C.M. Smit

MRS Proceedings / Volume 615 / 2000

DOI: http://dx.doi.org/10.1557/PROC-615-G6.1.1 (About DOI)

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Electrical And Microscopic Investigation Of E-Gun Evaporated Titanium Thin Films Electrical And Microscopic Investigation Of E-Gun Evaporated Titanium Thin Films

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Karl Hofmann, Martina Luysberg, Bernd Spangenberg and Heinrich Kurz

MRS Proceedings / Volume 615 / 2000

DOI: http://dx.doi.org/10.1557/PROC-615-G6.5.1 (About DOI)

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Work Function Study of Polycrystalline Metals using a UHV Scanning Kelvin Probe Work Function Study of Polycrystalline Metals using a UHV Scanning Kelvin Probe

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U. Petermann, I.D. Baikie, B. Lägel and K.M. Dirscherl

MRS Proceedings / Volume 615 / 2000

DOI: http://dx.doi.org/10.1557/PROC-615-G6.6.1 (About DOI)

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Characterization of Cu-Al alloy/SiO₂ interface microstructure Characterization of Cu-Al alloy/SiO₂ interface microstructure

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Pei-I Wang, S. P. Murarka, G.-R. Yang, E. Barnat, T.-M. Lu, Y.-C. Chen, Xiang Li and K. Rajan

MRS Proceedings / Volume 615 / 2000

DOI: http://dx.doi.org/10.1557/PROC-615-G7.5.1 (About DOI)

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Observation of Long-Range Orientational Ordering in Metal Films Evaporated at Oblique Incidence onto Glass Observation of Long-Range Orientational Ordering in Metal Films Evaporated at Oblique Incidence onto Glass

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David L. Everitt, X. D. Zhu, William J. Miller and Nicholas L. Abbott

MRS Proceedings / Volume 615 / 2000

DOI: http://dx.doi.org/10.1557/PROC-615-G7.7.1 (About DOI)

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Grain Boundary Curvature in Polycrystalline Metallic Thin Films Grain Boundary Curvature in Polycrystalline Metallic Thin Films

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Alexander H. King, Rakesh Mangat and Kwame Owusu-Boahen

MRS Proceedings / Volume 615 / 2000

DOI: http://dx.doi.org/10.1557/PROC-615-G7.8.1 (About DOI)

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Raman Spectroscopy: A Unique Tool for the Study of Thin Films Raman Spectroscopy: A Unique Tool for the Study of Thin Films

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Ingrid De Wolf

MRS Proceedings / Volume 615 / 2000

DOI: http://dx.doi.org/10.1557/PROC-615-G8.1.1 (About DOI)

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In Situ Curvature and Diffraction Studies of Pd Films on Si(001) During Solid-State Reaction In Situ Curvature and Diffraction Studies of Pd Films on Si(001) During Solid-State Reaction

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P. Gergaud, O. Thomas, B. Chenevier, V. Ghetta, A. Mouroux and S.L. Zhang

MRS Proceedings / Volume 615 / 2000

DOI: http://dx.doi.org/10.1557/PROC-615-G8.3.1 (About DOI)

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In Situ Stress and Strain Measurements During the Growth of Cu/Ni (001) Multilayers In Situ Stress and Strain Measurements During the Growth of Cu/Ni (001) Multilayers

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T. Bigault, F. Bocquet, S. Labat, O. Thomas, A. Marty and B. Gilles

MRS Proceedings / Volume 615 / 2000

DOI: http://dx.doi.org/10.1557/PROC-615-G8.6.1 (About DOI)

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Structural and Elastic Response of Mo/Ni Multilayers to Ion Irradiation Structural and Elastic Response of Mo/Ni Multilayers to Ion Irradiation

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Jérôme Pacaud, Franck Martin, Anny Michel, Christiane Jaouen, Philippe Djemia and François Ganot

MRS Proceedings / Volume 615 / 2000

DOI: http://dx.doi.org/10.1557/PROC-615-G8.7.1 (About DOI)

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