To access subscriptions and personalised features please log in or register
MRS Online Proceedings Library Home
Save Journal to My CJO Account
Browse Journal
Browse Articles
Table of Contents - Volume 616, Symposium I – New Methods, Mechanisms & Models of Vapor Deposition - 2000
Editors: W. Barker, G. Gilmer, H.N.G. Wadley
X. W. Zhou, W. Zou and H. N. G. Wadley
Copyright © Materials Research Society 2000
DOI: http://dx.doi.org/10.1557/PROC-616-103 (About DOI)
Post a Comment
D. Boyd, A. Tripathi, M. Gallivan, J. Musolf, A. Rosakis, H. Atwater and D. Goodwin
DOI: http://dx.doi.org/10.1557/PROC-616-109 (About DOI)
E. Nabighian, M. C. Bartelt and X.D. Zhu
DOI: http://dx.doi.org/10.1557/PROC-616-115 (About DOI)
I.I Oleinik, D.G. Pettifor, A.P. Sutton, C.C. Battaile, D.J. Srolovitz, J.E. Butler, D.S. Dandy, S.J. Harris and M.P. D'evelyn
DOI: http://dx.doi.org/10.1557/PROC-616-123 (About DOI)
J. Dalla Torreg, G. H. Gilmer, F. H. Baumann, P. O'Sullivan and M. Djafari Rouhani
DOI: http://dx.doi.org/10.1557/PROC-616-129 (About DOI)
W. Zou, X.W. Zhou, J.J. Quan, Y.G. Yang, H.N.G. Wadley, D. Brownell, D. Wang, S. Ghosal, D. Subhas, Robert Kosut and Jon Ebert
DOI: http://dx.doi.org/10.1557/PROC-616-135 (About DOI)
T. Smy, D. Vick, M. J. Brett, S. K. Dew, A. T. Wu, J.C. Sit and K. D. Harris
DOI: http://dx.doi.org/10.1557/PROC-616-141 (About DOI)
M.O. Bloomfield and T.S. Cale
DOI: http://dx.doi.org/10.1557/PROC-616-147 (About DOI)
J. Ramer, B. Patel, A. Patel, V. Boguslavskiy and A. Gurary
DOI: http://dx.doi.org/10.1557/PROC-616-15 (About DOI)
E.V. Yakovlev, R.A. Talalaev, S. Yu. Karpov, Yu.A. Shpolyanskiy, Yu.N. Makarov and S.A. Lowry
DOI: http://dx.doi.org/10.1557/PROC-616-153 (About DOI)
R. P. Pawlowski, C. Theodoropoulos, T.J. Mountziaris, H.K. Moffat, J. Han and E. J. Thrush
DOI: http://dx.doi.org/10.1557/PROC-616-159 (About DOI)
Andrei N. Vorob'ev, Alexandre E. Komissarov, Maxim V. Bogdanov, Sergey Yu. Karpov, Olga V. Bord, Alexandre I. Zhmakin, Andrei A. Lovtsus and Yuri N. Makarov
DOI: http://dx.doi.org/10.1557/PROC-616-165 (About DOI)
I.I. Oleinik, E.Yu. Tsymbal and D.G. Pettifor
DOI: http://dx.doi.org/10.1557/PROC-616-171 (About DOI)
H.-A. Durand, A. Suzuki, K. Nishimoto, K. Ito and I. Kataoka
DOI: http://dx.doi.org/10.1557/PROC-616-177 (About DOI)
A. Rakotomahevitra, L. T. Wille and M. S. Rakotomalala
DOI: http://dx.doi.org/10.1557/PROC-616-183 (About DOI)
Laurent Auvray, Hervé Dumont, Jacques Dazord, Yves Monteil and Jean Bouix
DOI: http://dx.doi.org/10.1557/PROC-616-189 (About DOI)
Rie Hayashi, Fumitomo Onishi, Mayu Uede and Yoshiki Takagi
DOI: http://dx.doi.org/10.1557/PROC-616-195 (About DOI)
N. Savvides, S. Gnanarajan, J. Herrmann, A. Thorley, A. Katsaros and A. Molodyk
DOI: http://dx.doi.org/10.1557/PROC-616-199 (About DOI)
T. Kudo, S. Sakuragi, S. Masui, K. Kinoshita, H. Makino and M. Tanaka
DOI: http://dx.doi.org/10.1557/PROC-616-205 (About DOI)
S. S. Mani, J. G. Fleming, J. J. Sniegowski, M. P. De Boer, L. W. Irwin, J. A. Walraven, D. M. Tanner and M. T. Dugger
DOI: http://dx.doi.org/10.1557/PROC-616-21 (About DOI)
Hyeongtag Jeon, Jae-Hyoung Koo, June-Woo Lee, Young-Seok Kim, K. M. Kang, Yang Do Kim and Young Do Kim
DOI: http://dx.doi.org/10.1557/PROC-616-211 (About DOI)
Q. Wei, S. Yamolenko, J. Sankar, A.K. Sharma, Y. Yamagata and J. Narayan
DOI: http://dx.doi.org/10.1557/PROC-616-217 (About DOI)
Mayu Uede and Yoshiki Takagi
DOI: http://dx.doi.org/10.1557/PROC-616-223 (About DOI)
M.S. Ramm, A.V. Kulik, I.A. Zhmakin, S.Yu. Karpov, O.V. Bord, S.E. Demina and Yu.N. Makarov
DOI: http://dx.doi.org/10.1557/PROC-616-227 (About DOI)
S. Witanachchi, P. Mahawela and P. Mukherjee
DOI: http://dx.doi.org/10.1557/PROC-616-235 (About DOI)
G. Grandinetti, S. Shanmugham, M.R. Hendrick and J.M. Hampikian
DOI: http://dx.doi.org/10.1557/PROC-616-241 (About DOI)
John C. Bean, S. Kanakaraju and Mark Lau
DOI: http://dx.doi.org/10.1557/PROC-616-27 (About DOI)
M.F. Chioncel, P.W. Haycock, F.Y. Ogrin, B.L. Ruthven and J.W. Bull
DOI: http://dx.doi.org/10.1557/PROC-616-3 (About DOI)
D. Sarigiannis, J.D. Peck, T.J. Mountziaris, G. Kioseoglou and A. Petrou
DOI: http://dx.doi.org/10.1557/PROC-616-41 (About DOI)
P. M. Voyles, M. M. J. Treacy and J. M. Gibson
DOI: http://dx.doi.org/10.1557/PROC-616-47 (About DOI)
P.W. Haycock, M.G. Lopez, J. Auld, J.W. Bull and E.W. Williams
DOI: http://dx.doi.org/10.1557/PROC-616-53 (About DOI)
Takashi Kato, Masahiro Nishida and Yoshiki Takagi
DOI: http://dx.doi.org/10.1557/PROC-616-59 (About DOI)
M. A. Gallivan, R. M. Murray and D. G. Goodwin
DOI: http://dx.doi.org/10.1557/PROC-616-61 (About DOI)
Jeong-Hoon Park, Woon-Jo Cho and Kug-Sun Hong
DOI: http://dx.doi.org/10.1557/PROC-616-67 (About DOI)
J.S. Pelt, R. Magahñ;a, M.E. Ramsey, E. Poindexter, S. Atwell, J.P. Zheng, S.M. Durbin and M. Kobayashi
DOI: http://dx.doi.org/10.1557/PROC-616-75 (About DOI)
C. Le Paven-Thivet, P. Aubert, S. Fusil, A. Zozime, C. Malibert and Ph. Houdy
DOI: http://dx.doi.org/10.1557/PROC-616-81 (About DOI)
D.P. Adams, J.A. Romero, M.A. Rodriguez, J.A. Floro and J.C. Banks
DOI: http://dx.doi.org/10.1557/PROC-616-87 (About DOI)
L. J. Simpson, B. S. Joshi, L. A. Gonzales, J. Verley and T. E. Furtak
DOI: http://dx.doi.org/10.1557/PROC-616-9 (About DOI)
S. M. George, J.D. Ferguson and J.W. Klaus
DOI: http://dx.doi.org/10.1557/PROC-616-93 (About DOI)