MRS Proceedings
- MRS Proceedings / Volume 615 / 2000
- Copyright © Materials Research Society 2000
- DOI: http://dx.doi.org/10.1557/PROC-615-G2.1.1 (About DOI)
Table of Contents - Volume 615 - Symposium G – Polycrystalline Metal & Magnetic Thin Films - 2000
Editors : B. Clemens, L. Gignac, J. MacLaren, O. Thomas
Articles
X-ray Probes of Magnetic Multilayer Structure
2000 MRS Spring Meeting.
B.K. Tannera1, T.P.A. Hasea1, B.D. Fulthorpea1, J. Clarkea1, G.M. Luo p1, S.K. Halder p2, A.S.H. Rozatiana1 and S.B. Wilkinsa1
a1 Department of Physics, University of Durham, South Road, Durham, DH1 3LE, U.K.
ABSTRACT
We discuss the application of x-ray scattering and fluorescence to the problem of unravelling the relationship between the structural and magnetic properties of magnetic multilayers. Particular attention is paid to the use of grazing incidence diffuse scatter to determine the compositional gradient, out-of-plane roughness amplitude, in-plane correlation length and fractal parameter of buried interfaces. Anomalous scattering provides information on the local environment of specific atoms and grazing incidence fluorescence is a depth -sensitive probe of chemical composition. We present examples indicating the sensitivity limits and the reproducibility of the techniques, all from multiple layer structures of magnetic metals.
Correspondence:
p1 Permanent address: Institute of Physics, Chinese Academy of Sciences, Beijing, China
p2 Permanent address: National Physical Laboratory, New Dehli, India
