MRS Proceedings

Table of Contents - Volume  31  - Symposium N – Electron Microscopy of Materials  

Articles

Electron Microscopy and Analysis at Higher Voltages: The Philips EM430 300kV Microscope

1983 MRS Meeting.

Peter N. Hagemanna1 and John S. Fahya2

a1 Electron Optics Laboratory, Philips Scientific and Industrial Equipment Division, N.V.Philips' Gloeilampenfabrieken, Eindhoven,The Netherlands.

a2 Product Manager, Electron Optics, Philips Electronic Instruments, Inc., Mahwah, N.J.

The past decade has seen the evolution of the Philips TEM from a “microscope”to an integrated microanalytical system. A current example of this trend is the EM 420*, an instrument whose design concepts are reflected in the most recently offered TEM, the compact, high kV, high resolution EM430.

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