MRS Proceedings

Articles

Computer Interfaced Electron Microscope

1983 MRS Meeting.

Y. Kokuboa1, S. Moriguchia1, J. Hosoia1, E. Watanabea1 and J. Nasha1a2

a1 Jeol Ltd., 1418 Nakagami, Akishima, Tokyo 196, Japan

a2 Jeol (U.S.A.) Inc., 11 Dearborn Road, Peabody, MA 01960, U.S.A.

ABSTRACT

Some applications of the computer for the electron microscope, in three major areas - 1) control of the microscope,2) image processing, and 3) structure Analysis - are discussed in the present paper.

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